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On work in progress optimisation

Gunn, Bruce and Nahavandi, Saeid 2002, On work in progress optimisation, in Multimedia, image processing, and soft computing : trends, principles, and applications : proceedings of the Fifth Biannual World Automation Congress (WAC 2002), ISSCI 2002, and IFMIP 2002, Orlando, Florida, USA, IEEE Xplore, Piscataway, N.J., pp. 631-636.

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Title On work in progress optimisation
Author(s) Gunn, Bruce
Nahavandi, SaeidORCID iD for Nahavandi, Saeid orcid.org/0000-0002-0360-5270
Conference name World Automation. Congress (5th : 2002 : Orlando, Fla.)
Conference location Orlando, Florida
Conference dates 9-13 Jun. 2002
Title of proceedings Multimedia, image processing, and soft computing : trends, principles, and applications : proceedings of the Fifth Biannual World Automation Congress (WAC 2002), ISSCI 2002, and IFMIP 2002, Orlando, Florida, USA
Editor(s) Jamshidi, Mo
Publication date 2002
Conference series World Automation Congress
Start page 631
End page 636
Total pages 6
Publisher IEEE Xplore
Place of publication Piscataway, N.J.
Keyword(s) optimum WIP
manufacturing
discrete-event simulation
Summary In this paper, we investigate how to best optimise the level of work in progress (WIP) in a real world factory. Using a simulation model of the factory, we show that an optimum level of WIP can be attained. By systematically varying the maximum allowable level of WIP within different model runs, results show that the throughput reaches a high level very quickly and then tapers off. The production lead times, in contrast, begin at relatively low levels and increase after the optimum WIP level has been reached.
Notes Current Version Published: 2002-12-10
ISBN 1889335185
9781889335186
Language eng
Field of Research 080110 Simulation and Modelling
Socio Economic Objective 970108 Expanding Knowledge in the Information and Computing Sciences
HERDC Research category E1 Full written paper - refereed
Copyright notice ©2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Free to Read? Yes
Persistent URL http://hdl.handle.net/10536/DRO/DU:30004885

Document type: Conference Paper
Collections: School of Engineering and Technology
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