Zheng, H., Nahavandi, Saeid, Pan, L. and Xiang, Yong 2003, Genetic learning based texture surface inspection, in Proceedings of the International Conference on Computational Intelligence, Robotics and Autonomous Systems : CIRAS 2001 : 28-30 November 2001, Singapore, CIRAS Organising Committee, Singapore.
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Proceedings of the International Conference on Computational Intelligence, Robotics and Autonomous Systems : CIRAS 2001 : 28-30 November 2001, Singapore
Editor(s)
Vadakkepat, Prahlad Wan, Tan Woei Chen, Tan Kay Poh, Loh Ai
Publication date
2003
Publisher
CIRAS Organising Committee
Place of publication
Singapore
Summary
This paper presents a novel approach of visual inspection for texture surface defects. It is based on the measure of texture energy acquired by a kind if high performance 2D detection mask, which is learned by genetic algorithms. Experimental results of texture defect inspection on textile images are presented to illustrate the merit and feasibility of the proposed method.
Notes
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ISSN
0219-6131
Language
eng
Field of Research
080199 Artificial Intelligence and Image Processing not elsewhere classified
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