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A lower bound on effective performance testing for digital forensic tools

Pan, Lei and Batten, Lynn 2007, A lower bound on effective performance testing for digital forensic tools, in SADFE 2007 : Second International Workshop on Systematic Approaches to Digital Forensic Engineering : proceedings : 10-12 April 2007, Seattle, Washington, USA, IEEE Computer Society, Los Alamitos, Calif., pp. 117-130.

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Title A lower bound on effective performance testing for digital forensic tools
Author(s) Pan, Lei
Batten, Lynn
Conference name International Workshop on Systematic Approaches to Digital Forensic Engineering (2nd : 2007 : Seattle, Wash.)
Conference location Seattle, Washington
Conference dates 10-12 April 2007
Title of proceedings SADFE 2007 : Second International Workshop on Systematic Approaches to Digital Forensic Engineering : proceedings : 10-12 April 2007, Seattle, Washington, USA
Editor(s) Huang, Ming-Yuh
Frincke, Deborah
Publication date 2007
Conference series International Workshop on Systematic Approaches to Digital Forensic Engineering
Start page 117
End page 130
Publisher IEEE Computer Society
Place of publication Los Alamitos, Calif.
Keyword(s) abstraction layer model
orthogonal arrays
partition testing
SADFE
software performance
Summary The increasing complexity and number of digital forensic tasks required in criminal investigations demand the development of an effective and efficient testing methodology, enabling tools of similar functionalities to be compared based on their performance. Assuming that the tool tester is familiar with the underlying testing platform and has the ability to use the tools correctly, we provide a numerical solution for the lower bound on the number of testing cases needed to determine comparative capabilities of any set of digital forensic tools. We also present a case study on the performance testing of password cracking tools, which allows us to confirm that the lower bound on the number of testing runs needed is closely related to the row size of certain orthogonal arrays. We show how to reduce the number of test runs by using knowledge of the underlying system
ISBN 0769528082
9780769528083
Language eng
Field of Research 080499 Data Format not elsewhere classified
Socio Economic Objective 970108
HERDC Research category E1 Full written paper - refereed
Copyright notice ©2007, IEEE Computer Society
Persistent URL http://hdl.handle.net/10536/DRO/DU:30008107

Document type: Conference Paper
Collections: School of Engineering and Information Technology
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