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A lower bound on effective performance testing for digital forensic tools Pan, Lei and Batten, Lynn 2007, A lower bound on effective performance testing for digital forensic tools, in SADFE 2007 : Second International Workshop on Systematic Approaches to Digital Forensic Engineering : proceedings : 10-12 April 2007, Seattle, Washington, USA, IEEE Computer Society, Los Alamitos, Calif., pp. 117-130. Attached Files Name Description MIMEType Size Downloads batten-lowerboundoneffective-2007.pdf Published version application/pdf 217.21KB 81 Title A lower bound on effective performance testing for digital forensic tools Author(s) Pan, Lei Batten, Lynn Conference name International Workshop on Systematic Approaches to Digital Forensic Engineering (2nd : 2007 : Seattle, Wash.) Conference location Seattle, Washington Conference dates 10-12 April 2007 Title of proceedings SADFE 2007 : Second International Workshop on Systematic Approaches to Digital Forensic Engineering : proceedings : 10-12 April 2007, Seattle, Washington, USA Editor(s) Huang, Ming-Yuh Frincke, Deborah Publication date 2007 Conference series International Workshop on Systematic Approaches to Digital Forensic Engineering Start page 117 End page 130 Publisher IEEE Computer Society Place of publication Los Alamitos, Calif. Keyword(s) abstraction layer model orthogonal arrays partition testing SADFE software performance Summary The increasing complexity and number of digital forensic tasks required in criminal investigations demand the development of an effective and efficient testing methodology, enabling tools of similar functionalities to be compared based on their performance. Assuming that the tool tester is familiar with the underlying testing platform and has the ability to use the tools correctly, we provide a numerical solution for the lower bound on the number of testing cases needed to determine comparative capabilities of any set of digital forensic tools. We also present a case study on the performance testing of password cracking tools, which allows us to confirm that the lower bound on the number of testing runs needed is closely related to the row size of certain orthogonal arrays. We show how to reduce the number of test runs by using knowledge of the underlying system ISBN 0769528082 9780769528083 Language eng Field of Research 080499 Data Format not elsewhere classified Socio Economic Objective 970108 HERDC Research category E1 Full written paper - refereed Copyright notice ©2007, IEEE Computer Society Persistent URL http://hdl.handle.net/10536/DRO/DU:30008107 Document type: Conference Paper Collections: School of Engineering and Information Technology Open Access Collection Related Links Link Description Connect to published version (restricted access) Go to link with your DU access privileges     Unless expressly stated otherwise, the copyright for items in DRO is owned by the author, with all rights reserved. Every reasonable effort has been made to ensure that permission has been obtained for items included in DRO. If you believe that your rights have been infringed by this repository, please contact drosupport@deakin.edu.au. Versions Version Filter Type Mon, 08 Dec 2008, 07:56:17 EST Wed, 27 May 2009, 15:29:06 EST Thu, 26 Aug 2010, 15:01:05 EST Fri, 16 Mar 2012, 16:26:23 EST Mon, 14 Oct 2013, 11:34:21 EST Fri, 17 Oct 2014, 09:00:27 EST Filtered Full Access Statistics: 463 Abstract Views, 81 File Downloads  -  Detailed Statistics Created: Mon, 29 Sep 2008, 09:04:38 EST

Every reasonable effort has been made to ensure that permission has been obtained for items included in DRO. If you believe that your rights have been infringed by this repository, please contact drosupport@deakin.edu.au.