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Depth estimation using multi-wavelet analysis based stereo vision approach

Bhatti, Asim and Nahavandi, Saeid 2007, Depth estimation using multi-wavelet analysis based stereo vision approach, in Wavelet analysis and pattern recognition, IEEE Xplore, Piscataway, N.J., pp. 1471-1476.

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Title Depth estimation using multi-wavelet analysis based stereo vision approach
Author(s) Bhatti, Asim
Nahavandi, Saeid
Conference name International Conference on Wavelet Analysis and Pattern Recognition (2007: Beijing, China)
Conference location Beijing, China
Conference dates 2-4 November 2007
Title of proceedings Wavelet analysis and pattern recognition
Editor(s) Institute of Electrical and Electronics Engineers (IEEE)
Publication date 2007
Conference series International Conference on Wavelet Analysis and Pattern Recognition
Start page 1471
End page 1476
Publisher IEEE Xplore
Place of publication Piscataway, N.J.
Keyword(s) 3D depth estimation
disparity estimation
multiwavelets transform modulus maxima
stereo vision
Summary The problem of dimensional defects in aluminum die- casting is widespread throughout the foundry industry and their detection is of paramount importance in maintaining product quality. Due to the unpredictable factory environment and metallic, with highly reflective, nature of aluminum die-castings, it is extremely hard to estimate true dimensionality of the die-casting, autonomously. In this work, we propose a novel robust 3D reconstruction algorithm capable of reconstructing dimensionally accurate 3D depth models of the aluminum die-castings. The developed system is very simple and cost effective as it consists of only a stereo cameras pair and a simple fluorescent light. The developed system is capable of estimating surface depths within the tolerance of 1.5 mm. Moreover, the system is invariant to illuminative variations and orientation of the objects in the input image space, which makes the developed system highly robust. Due to its hardware simplicity and robustness, it can be implemented in different factory environments without a significant change in the setup.
Notes This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
ISBN 1424410665
9781424410668
9781424410651
1424410657
Language eng
Field of Research 080106 Image Processing
HERDC Research category E1 Full written paper - refereed
Copyright notice ©2007, IEEE
Persistent URL http://hdl.handle.net/10536/DRO/DU:30008196

Document type: Conference Paper
Collections: School of Engineering and Information Technology
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