Eliminating of the drawback of existing testing technique of easily testable PLAs using an improved testing algorithm with product line rearrangement

Islam, Md. Rafiqul and Chowdhury, Morshed 2002, Eliminating of the drawback of existing testing technique of easily testable PLAs using an improved testing algorithm with product line rearrangement, in International Society for Computers and their Applications : 15th International conference on computer applications in industry and engineering, International Society for Computers and their Applications, Cary, N.C., pp. 239-242.


Title Eliminating of the drawback of existing testing technique of easily testable PLAs using an improved testing algorithm with product line rearrangement
Author(s) Islam, Md. Rafiqul
Chowdhury, Morshed
Conference name International Conference Computer Applications in Industry and Engineering (15th : 2002 : San Diego, California)
Conference location San Diego, California, USA
Conference dates 7-9 November 2002
Title of proceedings International Society for Computers and their Applications : 15th International conference on computer applications in industry and engineering
Editor(s) Subramanya, S. R.
Publication date 2002
Start page 239
End page 242
Publisher International Society for Computers and their Applications
Place of publication Cary, N.C.
ISBN 1880843455
9781880843451
Language eng
Field of Research 100606 Processor Architectures
HERDC Research category E1 Full written paper - refereed
Copyright notice ©2002, International Society for Computers and their Applications
Persistent URL http://hdl.handle.net/10536/DRO/DU:30009540

Document type: Conference Paper
Collection: School of Information Technology
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