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Image processing and pattern recognition in textiles

Kong, Lingxue and She, F. H. 2001, Image processing and pattern recognition in textiles, in SPIE 2001 : Data mining and applications : 23-24 October 2001, Wuhan, China, SPIE, Washington, D.C., pp. 1-6.


Title Image processing and pattern recognition in textiles
Formatted title
Author(s) Kong, Lingxue
She, F. H.
Conference name Society of Photo-optical Instrumentation Engineers (2001 : Wuhan, China)
Conference location Wuhan, China
Conference dates 22-24 October 2001
Title of proceedings SPIE 2001 : Data mining and applications : 23-24 October 2001, Wuhan, China
Editor(s) Li, Deren
Publication date 2001
Series Proceedings of SPIE--the International Society for Optical Engineering ; v. 4556
Start page 1
End page 6
Publisher SPIE
Place of publication Washington, D.C.
Keyword(s) pattern recognition
classification
hybrid artificial neural networks
animal fibers
Summary Image processing and pattern recognition have been successfully applied in many textile related areas. For example, they have been used in defect detection of cotton fibers and various fabrics. In this work, the application of image processing into animal fiber classification is discussed. Integrated into / with artificial neural networks, the image processing technique has provided a useful tool to solve complex problems in textile technology. Three different approaches are used in this work forfiber classification and pattern recognition: feature extraction with image process, pattern recognition and classification with artificial neural networks, and feature recognition and classification with artificial neural network. All of them yieldssatisfactory results by giving a high level of accuracy in classification.
ISBN 0819442844
9780819442840
Language eng
Field of Research 091012 Textile Technology
HERDC Research category E2 Full written paper - non-refereed / Abstract reviewed
Copyright notice ©2001, SPIE
Persistent URL http://hdl.handle.net/10536/DRO/DU:30013685

Document type: Conference Paper
Collection: School of Engineering and Technology
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