Openly accessible

Depth-profile analysis of elements by glow discharge optical emmission specrometry

Long, John 2001, Depth-profile analysis of elements by glow discharge optical emmission specrometry, in APCNDT 2001 : technology 2001 and beyond : Proceedings of the 10th Asia-Pacific Conference on Non-Destructive Testing, Australian Institute for Non Destructive Testing, Australia, pp. 1-6.

Attached Files
Name Description MIMEType Size Downloads
long-depthprofile-2001.pdf Published version application/pdf 67.29KB 229

Title Depth-profile analysis of elements by glow discharge optical emmission specrometry
Author(s) Long, John
Conference name Asia-Pacific Conference on Non-Destructive Testing (10th : 2001 : Brisbane, Qld.)
Conference location Brisbane, Qld.
Conference dates 17-21 September 2001
Title of proceedings APCNDT 2001 : technology 2001 and beyond : Proceedings of the 10th Asia-Pacific Conference on Non-Destructive Testing
Publication date 2001
Start page 1
End page 6
Publisher Australian Institute for Non Destructive Testing
Place of publication Australia
Keyword(s) GD-OES
glow discharge
depth profiling
surface analysis
emission spectrometry
Summary Glow-discharge optical emission spectrometry (GD-OES) is a powerful tool for the rapid analysis of elements in the surface of solids. One may employ GD-OES to determine quantitatively the bulk concentration of elements in a sample. With further calibration, one may also obtain elemental concentrations as a function of depth into the sample. This allows depth profiling on a host of advanced materials: treated metals, coated metals and other materials, multi-layers, painted surfaces, hard samples coated with polymers, thin films, and many others.

A consortium of institutions in Victoria, led by Deakin University, has purchased a new glow-discharge optical emission spectrometer. This instrument has the ability to perform elemental depth profiling on a wide range of materials. This technique, the first of its kind in Australia, is of particular interest to those working on metals, ceramics, glasses, coatings, semi-conductors, and multi-layers. We present here an overview of depth profiling by GD-OES and some examples of its use.
Language eng
Field of Research 091299 Materials Engineering not elsewhere classified
HERDC Research category L2 Full written paper - non-refereed (minor conferences)
Copyright notice ©2001, Australian Institute for Non Destructive Testing
Persistent URL http://hdl.handle.net/10536/DRO/DU:30015577

Document type: Conference Paper
Collections: School of Engineering and Technology
Open Access Collection
Connect to link resolver
 
Unless expressly stated otherwise, the copyright for items in DRO is owned by the author, with all rights reserved.

Every reasonable effort has been made to ensure that permission has been obtained for items included in DRO. If you believe that your rights have been infringed by this repository, please contact drosupport@deakin.edu.au.

Versions
Version Filter Type
Access Statistics: 384 Abstract Views, 229 File Downloads  -  Detailed Statistics
Created: Wed, 12 Nov 2008, 13:05:11 EST

Every reasonable effort has been made to ensure that permission has been obtained for items included in DRO. If you believe that your rights have been infringed by this repository, please contact drosupport@deakin.edu.au.