Depth-profile analysis of elements by glow discharge optical emmission specrometry
Long, John 2001, Depth-profile analysis of elements by glow discharge optical emmission specrometry, in APCNDT 2001 : technology 2001 and beyond : Proceedings of the 10th Asia-Pacific Conference on Non-Destructive Testing, Australian Institute for Non Destructive Testing, Australia, pp. 1-6.
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Glow-discharge optical emission spectrometry (GD-OES) is a powerful tool for the rapid analysis of elements in the surface of solids. One may employ GD-OES to determine quantitatively the bulk concentration of elements in a sample. With further calibration, one may also obtain elemental concentrations as a function of depth into the sample. This allows depth profiling on a host of advanced materials: treated metals, coated metals and other materials, multi-layers, painted surfaces, hard samples coated with polymers, thin films, and many others.
A consortium of institutions in Victoria, led by Deakin University, has purchased a new glow-discharge optical emission spectrometer. This instrument has the ability to perform elemental depth profiling on a wide range of materials. This technique, the first of its kind in Australia, is of particular interest to those working on metals, ceramics, glasses, coatings, semi-conductors, and multi-layers. We present here an overview of depth profiling by GD-OES and some examples of its use.
Field of Research
091299 Materials Engineering not elsewhere classified
HERDC Research category
L2 Full written paper - non-refereed (minor conferences)
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