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An investigation of the native oxide of aluminum alloy 7475-T7651 using XPS, AES, TEM, EELS, GDOES and RBS

Toh, S. K., McCulloch, D., du Plessis, Johan, Paterson, P. J. K., Hughes, A. E., Jamieson, D., Rout, B., Long, John and Stonham, A. 2002, An investigation of the native oxide of aluminum alloy 7475-T7651 using XPS, AES, TEM, EELS, GDOES and RBS, in 7th International Conference on the Structure of Surfaces, World Scientific, Singapore, pp. 1-1.

Document type: Conference Paper
Collection: School of Engineering and Technology

Title An investigation of the native oxide of aluminum alloy 7475-T7651 using XPS, AES, TEM, EELS, GDOES and RBS
Author(s) Toh, S. K.
McCulloch, D.
du Plessis, Johan
Paterson, P. J. K.
Hughes, A. E.
Jamieson, D.
Rout, B.
Long, John
Stonham, A.
Conference name International Conference on the Structure of Surfaces (7th : 2002 : Newcastle, N.S.W.)
Conference location Newcastle, N.S.W.
Conference dates 21-26 July 2002
Title of proceedings 7th International Conference on the Structure of Surfaces
Publication date 2002
Start page 1
End page 1
Publisher World Scientific
Place of publication Singapore
Language eng
Field of Research 091207 Metals and Alloy Materials
HERDC Research category L3 Extract of paper (minor conferences)
Persistent URL http://hdl.handle.net/10536/DRO/DU:30015662
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