Characterisation of deformed microstructures using field-emission gun scanning electron microscopy (FEG-SEM) and electron backscatter diffraction (EBSD)

Nave, M. and Barnett, Matthew 2004, Characterisation of deformed microstructures using field-emission gun scanning electron microscopy (FEG-SEM) and electron backscatter diffraction (EBSD), in ACMM18 : Microscopy by the Bay, Australian Microscopy and Microanalysis Society, [Canberra, A.C.T.], pp. 43-43.


Title Characterisation of deformed microstructures using field-emission gun scanning electron microscopy (FEG-SEM) and electron backscatter diffraction (EBSD)
Author(s) Nave, M.
Barnett, Matthew
Conference name Australian Conference on Microscopy and Microanalysis (18th : 2004 : Geelong, Vic.)
Conference location Geelong, Vic.
Conference dates 2-6 February 2004
Title of proceedings ACMM18 : Microscopy by the Bay
Editor(s) Crameri, S.
Horne, M.D.
Hyatt, A.D.
Lucas, L.
Marshall, A.T.
McCulloch, D.G.
Miller, P.R.
Spargo, A.
Van Driel, R.
Veitch, C.
Walker, M.
Ward, J.V.
Publication date 2004
Start page 43
End page 43
Publisher Australian Microscopy and Microanalysis Society
Place of publication [Canberra, A.C.T.]
ISBN 0958040826
9780958040822
Language eng
Field of Research 091207 Metals and Alloy Materials
HERDC Research category L3 Extract of paper (minor conferences)
Persistent URL http://hdl.handle.net/10536/DRO/DU:30015747

Document type: Conference Paper
Collection: School of Engineering and Technology
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