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Die temperature monitoring of high pressure die casting

Kong, L.X., She, F.H., Nahavandi, S. and Kouzani, A.Z. 2000, Die temperature monitoring of high pressure die casting, in SMC 2000 conference proceedings : 2000 IEEE International Conference on Systems, Man & Cybernetics : Cybernetics evolving to systems, humans, organizations, and their complex interactions : October 8-11, 2000, Sheraton Music City Hotel, Nashville, Tennessee, USA, IEEE, Piscataway, N.J., pp. 1756-1761.


Title Die temperature monitoring of high pressure die casting
Author(s) Kong, L.X.
She, F.H.
Nahavandi, S.
Kouzani, A.Z.
Conference name IEEE International Conference on Systems, Man, and Cybernetics (2000 : Nashville, Tenn.)
Conference location Nashville, Tenn.
Conference dates 8-11 Oct. 2000
Title of proceedings SMC 2000 conference proceedings : 2000 IEEE International Conference on Systems, Man & Cybernetics : Cybernetics evolving to systems, humans, organizations, and their complex interactions : October 8-11, 2000, Sheraton Music City Hotel, Nashville, Tennessee, USA
Publication date 2000
Start page 1756
End page 1761
Publisher IEEE
Place of publication Piscataway, N.J.
ISBN 0780365836
9780780365834
0780365844
9780780365841
0780365852
9780780365858
0780365860
9780780365865
ISSN 1062-922X
Language eng
Field of Research 080106 Image Processing
Socio Economic Objective 970110 Expanding Knowledge in Technology
HERDC Research category E2 Full written paper - non-refereed / Abstract reviewed
Persistent URL http://hdl.handle.net/10536/DRO/DU:30026091

Document type: Conference Paper
Collection: School of Engineering and Technology
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