TOF-SIMS analysis using C60. Effect of impact energy on yield and damage

Fletcher, John S., Conlan, Xavier A., Jones, Emrys A., Biddulph, Greg, Lockyer, Nicholas P. and Vickerman, John C. 2006, TOF-SIMS analysis using C60. Effect of impact energy on yield and damage, Analytical chemistry, vol. 78, no. 6, pp. 1827-1831.

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Title TOF-SIMS analysis using C60. Effect of impact energy on yield and damage
Formatted title TOF-SIMS analysis using C60. Effect of impact energy on yield and damage
Author(s) Fletcher, John S.
Conlan, Xavier A.
Jones, Emrys A.
Biddulph, Greg
Lockyer, Nicholas P.
Vickerman, John C.
Journal name Analytical chemistry
Volume number 78
Issue number 6
Start page 1827
End page 1831
Publisher American Chemical Society
Place of publication Washington, D.C.
Publication date 2006-03-15
ISSN 0003-2700
1520-6882
1520-4782
Summary C60 has been shown to give increased sputter yields and, hence, secondary ions when used as a primary particle in SIMS analysis. In addition, for many samples, there is also a reduction in damage accumulation following continued bombardment with the ion beam. In this paper, we report a study of the impact energy (up to 120 keV) of C60 on the secondary ion yield from a number of samples with consideration of any variation in yield response over mass ranges up to m/z 2000. Although increased impact energy is expected to produce a corresponding increase in sputter yield/rate, it is important to investigate any increase in sample damage with increasing energy and, hence, efficiency of the ion beams. On our test samples including a metal, along with organic samples, there is a general increase in secondary ion yield of high-mass species with increasing impact energy. A corresponding reduction in the formation of low-mass fragments is also observed. Depth profiling of organic samples demonstrates that when using C60, there does not appear to be any increase in damage evident in the mass spectra as the impact energy is increased.
Language eng
Field of Research 030199 Analytical Chemistry not elsewhere classified
HERDC Research category C1.1 Refereed article in a scholarly journal
Copyright notice ©2006, American Chemical Society
Persistent URL http://hdl.handle.net/10536/DRO/DU:30028594

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