Direct observation of defect levels in hexagonal BN by soft X-ray absorption spectroscopy

Bozanic, A., Petravic, M., Fan, L.-J., Yang, Y.-W. and Chen, Y. 2009, Direct observation of defect levels in hexagonal BN by soft X-ray absorption spectroscopy, Chemical physics letters, vol. 472, no. 4-6, pp. 190-193.

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Title Direct observation of defect levels in hexagonal BN by soft X-ray absorption spectroscopy
Author(s) Bozanic, A.
Petravic, M.
Fan, L.-J.
Yang, Y.-W.
Chen, Y.
Journal name Chemical physics letters
Volume number 472
Issue number 4-6
Start page 190
End page 193
Total pages 4
Publisher Elsevier B V
Place of publication Amsterdam, The Netherlands
Publication date 2009-04
ISSN 0009-2614
1873-4448
Summary Formation of defects in hexagonal boron nitride under low-energy argon bombardment has been studied by near-edge X-ray absorption fine structure (NEXAFS) around B and N K-edges. Breaking of B-N bonds and creation of nitrogen vacancies has been identified from the B K-edge, followed by the formation of molecular nitrogen, N2, at interstitial positions. The presence of N2 produces a sharp resonance in the low-resolution NEXAFS spectra around N K-edge, showing the characteristic vibrational fine structure in high-resolution measurements. Several new peaks in NEXAFS spectra have been assigned to boron or nitrogen interstitials, in good agreement with theoretical predictions. © 2009 Elsevier B.V. All rights reserved.
Language eng
Field of Research 100706 Nanofabrication, Growth and Self Assembly
Socio Economic Objective 970110 Expanding Knowledge in Technology
HERDC Research category C1 Refereed article in a scholarly journal
Persistent URL http://hdl.handle.net/10536/DRO/DU:30029184

Document type: Journal Article
Collection: Institute for Technology Research and Innovation
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