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Analysis of networked RFID system reliability

Abawajy, Jemal and Kim, Taihoonn 2012, Analysis of networked RFID system reliability, in AITS 2012 : Proceedings of the 2012 International Conference on Advanced Information Technology and Sensor Application, The Conference, Daejeon, Korea, pp. 1-1.

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Title Analysis of networked RFID system reliability
Author(s) Abawajy, Jemal
Kim, Taihoonn
Conference name Advanced Information Technology and Sensor Application. Conference (2012 : Daejeon, Korea)
Conference location Daejeon, Korea
Conference dates 28-29 Feb. 2012
Title of proceedings AITS 2012 : Proceedings of the 2012 International Conference on Advanced Information Technology and Sensor Application
Editor(s) [Unknown]
Publication date 2012
Conference series Advanced Information Technology and Sensor Application. Conference
Start page 1
End page 1
Total pages 1
Publisher The Conference
Place of publication Daejeon, Korea
Summary The ability to uniquely identify individual objects is essential in many applications such as manufacturing, distribution logistics, access control, anti-counterfeiting and healthcare. Radio Frequency Identification (RFID) technology provides one solution for automatic identification of entities using radio waves. Although there is considerable potential in deploying RFID technology, reliability is a key challenge that requires careful attention for RFID to deliver its inherent benefits. In this paper, we highlight the reliability challenges in RFID technology and we analyze the reliability aspects of RFID technology and their major causes. We will also discuss techniques to improve the reliability of RFID systems.
Language eng
Field of Research 089999 Information and Computing Sciences not elsewhere classified
Socio Economic Objective 970108 Expanding Knowledge in the Information and Computing Sciences
HERDC Research category E3 Extract of paper
Persistent URL http://hdl.handle.net/10536/DRO/DU:30049213

Document type: Conference Paper
Collection: School of Information Technology
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