Describing data quality problems in business intelligence systems through a metadata framework
Yeoh, William, Wang, Te-Wei and Verbitskiy, Yuriy 2012, Describing data quality problems in business intelligence systems through a metadata framework, in AMCIS 2012 : Proceedings of the 18th Americas Conference on Information Systems, AMCIS, [Seattle, Wash.], pp. 1-10.
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Describing data quality problems in business intelligence systems through a metadata framework
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