Surface structure of SnOxNy thin films deposited using a filtered cathodic arc for novel energy storage systems

Field, M.R., McCulloch, D.G., Leal, D.R. and Dai, X. J. 2012, Surface structure of SnOxNy thin films deposited using a filtered cathodic arc for novel energy storage systems, in APMC 10/ ICONN 2012 / ACMM 22 : Proceedings of the 2012 10th Asia-Pacific Microscopy Conference, 2012 International Conference on Nanoscience and Nanotechnology and 22nd Australian Conference on Microscopy and Microanalysis combined conference, [The Conference], [Perth, W.A.], pp. 886-1-886-2.

Attached Files
Name Description MIMEType Size Downloads

Title Surface structure of SnOxNy thin films deposited using a filtered cathodic arc for novel energy storage systems
Formatted title Surface structure of SnOxNy thin films deposited using a filtered cathodic arc for novel energy storage systems
Author(s) Field, M.R.
McCulloch, D.G.
Leal, D.R.
Dai, X. J.
Conference name Combined Asia-Pacific Microscopy & Nanoscience and Nanotechnology & Microscopy and Microanalysis. Conference (2012 : Perth, Western Australia)
Conference location Perth, W.A.
Conference dates 6-9 Feb. 2012
Title of proceedings APMC 10/ ICONN 2012 / ACMM 22 : Proceedings of the 2012 10th Asia-Pacific Microscopy Conference, 2012 International Conference on Nanoscience and Nanotechnology and 22nd Australian Conference on Microscopy and Microanalysis combined conference
Editor(s) [Unknown]
Publication date 2012
Conference series Combined Asia-Pacific Microscopy & Nanoscience and Nanotechnology & Microscopy and Microanalysis Conference
Start page 886-1
End page 886-2
Publisher [The Conference]
Place of publication [Perth, W.A.]
Summary Tin oxide/nitride (SnOxNy) thin films were synthesised using a filtered cathodic vacuum arc deposition system. These films were deposited at room temperature with increasing amounts of reactive nitrogen gas to alter the nanostructure. To understand the surface structure of the coatings several techniques were used including scanning electron microscopy (SEM), atomic force microscopy (AFM), x-ray photoelectron spectroscopy (XPS), x-ray diffraction (XRD) and x-ray absorption spectroscopy (XAS). Preliminary results have shown that a cathodic arc can be used to deposit smooth films which exhibit a mixed tin oxide/nitride structure.
Language eng
Field of Research 020204 Plasma Physics
091205 Functional Materials
091305 Energy Generation, Conversion and Storage Engineering
Socio Economic Objective 850602 Energy Storage (excl. Hydrogen)
HERDC Research category E2 Full written paper - non-refereed / Abstract reviewed
Persistent URL http://hdl.handle.net/10536/DRO/DU:30051128

Document type: Conference Paper
Collection: Institute for Frontier Materials
Connect to link resolver
 
Unless expressly stated otherwise, the copyright for items in DRO is owned by the author, with all rights reserved.

Versions
Version Filter Type
Access Statistics: 42 Abstract Views, 1 File Downloads  -  Detailed Statistics
Created: Wed, 13 Mar 2013, 08:50:06 EST

Every reasonable effort has been made to ensure that permission has been obtained for items included in DRO. If you believe that your rights have been infringed by this repository, please contact drosupport@deakin.edu.au.