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Determining the dislocation contrast factor for x-ray line profile analysis

Armstrong, N. and Lynch, P.A. 2003, Determining the dislocation contrast factor for x-ray line profile analysis. In Mittemeijer, E. J. and Scardi, P. (ed), Diffraction analysis of the microstructure of materials, Springer, Berlin, Germany, pp.249-285.

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Title Determining the dislocation contrast factor for x-ray line profile analysis
Author(s) Armstrong, N.
Lynch, P.A.
Title of book Diffraction analysis of the microstructure of materials
Editor(s) Mittemeijer, E. J.
Scardi, P.
Publication date 2003
Series Springer series in materials science, 0933-033X ; 68
Chapter number 1
Total chapters 1
Start page 249
End page 285
Total pages 37
Publisher Springer
Place of Publication Berlin, Germany
ISBN 03540405194
Language eng
Field of Research 029999 Physical Sciences not elsewhere classified
Socio Economic Objective 970102 Expanding Knowledge in the Physical Sciences
HERDC Research category B1.1 Book chapter
Copyright notice ©2003, Springer
Persistent URL http://hdl.handle.net/10536/DRO/DU:30052434

Document type: Book Chapter
Collection: Faculty of Health
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