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In-situ studies of X-ray diffraction line profiles from strained copper foils

Cheary, R.W., Tang, C.C., Lynch, P.A., Roberts, M.A. and Clark, S.M. 2001, In-situ studies of X-ray diffraction line profiles from strained copper foils, Materials science forum, vol. 378-381, pp. 254-261, doi: 10.4028/www.scientific.net/MSF.378-381.254.

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Title In-situ studies of X-ray diffraction line profiles from strained copper foils
Author(s) Cheary, R.W.
Tang, C.C.
Lynch, P.A.
Roberts, M.A.
Clark, S.M.
Journal name Materials science forum
Volume number 378-381
Start page 254
End page 261
Total pages 8
Publisher Trans Tech Publications
Place of publication Stafa-Zurich, Switzerland
Publication date 2001
ISSN 0255-5476
Keyword(s) copper
crystallite size
dislocation
in situ strain analysis
line broadening analysis
strain analysis
Summary The development of an in-situ tensometer is described along with preliminary results of x-ray line profiles from copper foils under tensile stress. The tensometer was designed and constructed on the high resolution diffraction instrument, Station 2.3 at the synchrotron radiation source (SRS) Daresbury Laboratory, and is capable of collecting data in either symmetric or asymmetric geometry including transmission and reflection modes. Experiments were carried out using 18 J..Lm thick copper foil up to strain levels of 5 % using both symmetric reflection and symmetric transmission diffraction. All profiles displayed diffraction broadening and asymmetry which increased with strain. In addition, the asymmetry observed in symmetric transmission was associated with extended tails on the low angle side of the profiles, but in symmetric reflection data the opposite asymmetry was observed. In the analysis, the measured profiles were fitted using the software TOPAS, a fundamental parameters approach to profile fitting. The instrumental profile function was characterised and modelled using annealed LaB6 powder. The diffraction broadening was then determined by refining the convolution of a Voigt function, an asymmetric exponential function and a fixed instrument function to reproduce the observed broadened profiles. The integral breadth and asymmetry results display a strong order dependence and increase almost linearly with strain. The results were interpreted by assuming crystallite size broadening in combination with dislocation broadening arising from fcc a/2( 110) {Ill } dislocations.
Notes This paper was presented at the 7th European Powder Diffraction Conference; Barcelona; Spain; 20 May 2000 through 23 May 2000
Language eng
DOI 10.4028/www.scientific.net/MSF.378-381.254
Field of Research 029999 Physical Sciences not elsewhere classified
Socio Economic Objective 970102 Expanding Knowledge in the Physical Sciences
HERDC Research category C1.1 Refereed article in a scholarly journal
Copyright notice ©2001, Trans Tech Publications
Persistent URL http://hdl.handle.net/10536/DRO/DU:30052457

Document type: Journal Article
Collection: Institute for Frontier Materials
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