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Compute inclusion depth of a pattern

Luo, Wei 2005, Compute inclusion depth of a pattern, in Learning Theory : 18th annual conference on learning theory, COLT 2005 Bertinoro, Italy June 27-30, 2005 : proceedings, Springer, Berlin, Germany, pp. 689-690, doi: 10.1007/11503415_48.

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Title Compute inclusion depth of a pattern
Author(s) Luo, WeiORCID iD for Luo, Wei orcid.org/0000-0002-4711-7543
Conference name Conference on Computational Learning Theory (18th : 2005 : Bertinoro, Italy)
Conference location Bertinoro, Italy
Conference dates 27-30 Jun. 2005
Title of proceedings Learning Theory : 18th annual conference on learning theory, COLT 2005 Bertinoro, Italy June 27-30, 2005 : proceedings
Editor(s) Auer, Peter
Meir, Ron
Publication date 2005
Conference series Conference on Computational Learning Theory
Start page 689
End page 690
Total pages 2
Publisher Springer
Place of publication Berlin, Germany
Summary We define a concept of inclusion depth (see Definition 1) to capture mind-change complexity [3,1] of pattern identification problems [2]. Our basic question is whether the inclusion depth for any pattern is computable. We conjecture a combinatorial characterization that, if true, leads to a linear time algorithm to compute inclusion depth.
ISBN 9783540265566
3540265562
Language eng
DOI 10.1007/11503415_48
Field of Research 170203 Knowledge Representation and Machine Learning
Socio Economic Objective 970108 Expanding Knowledge in the Information and Computing Sciences
HERDC Research category E1.1 Full written paper - refereed
Copyright notice ©2005, Springer
Persistent URL http://hdl.handle.net/10536/DRO/DU:30052503

Document type: Conference Paper
Collection: Centre for Pattern Recognition and Data Analytics
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