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Time-resolved in situ synchrotron x-ray diffraction studies of type 1 silicon clathrate formation

Hutchins, Peter T., Leynaud, Olivier, O’Dell, Luke A., Smith, Mark E., Barnes, Paul and McMillan, Paul F. 2011, Time-resolved in situ synchrotron x-ray diffraction studies of type 1 silicon clathrate formation, Chemistry of materials, vol. 23, no. 23, pp. 5160-5167, doi: 10.1021/cm2018136.

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Title Time-resolved in situ synchrotron x-ray diffraction studies of type 1 silicon clathrate formation
Author(s) Hutchins, Peter T.
Leynaud, Olivier
O’Dell, Luke A.ORCID iD for O’Dell, Luke A. orcid.org/0000-0002-7760-5417
Smith, Mark E.
Barnes, Paul
McMillan, Paul F.
Journal name Chemistry of materials
Volume number 23
Issue number 23
Start page 5160
End page 5167
Total pages 8
Publisher American Chemical Society
Place of publication Washington, D.C.
Publication date 2011-12-13
ISSN 0897-4756
1520-5002
Keyword(s) in situ studies
Na8Si46
NaSi
NMR spectroscopy
silicon clathrate
solid-state synthesis
synchrotron radiation
x-ray diffraction
zintl phase
Language eng
DOI 10.1021/cm2018136
Field of Research 030301 Chemical Characterisation of Materials
Socio Economic Objective 970103 Expanding Knowledge in the Chemical Sciences
HERDC Research category C1.1 Refereed article in a scholarly journal
Copyright notice ©2011, American Chemical Society
Persistent URL http://hdl.handle.net/10536/DRO/DU:30055593

Document type: Journal Article
Collection: Institute for Frontier Materials
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