Intuitive haptics interface with accurate force estimation and reflection at nanoscale

Bhatti, Asim, Khan, Burhan, Nahavandi, Saeid, Hanoun, Samer and Gao, David 2015, Intuitive haptics interface with accurate force estimation and reflection at nanoscale, in WCGO 2015 : Advances in Global Optimization. Proceedings of the 3rd World Congress of Global Optimaization, Springer, New York, N.Y., pp. 507-514, doi: 10.1007/978-3-319-08377-3_49.

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Title Intuitive haptics interface with accurate force estimation and reflection at nanoscale
Author(s) Bhatti, AsimORCID iD for Bhatti, Asim orcid.org/0000-0001-6876-1437
Khan, Burhan
Nahavandi, SaeidORCID iD for Nahavandi, Saeid orcid.org/0000-0002-0360-5270
Hanoun, SamerORCID iD for Hanoun, Samer orcid.org/0000-0002-8697-1515
Gao, David
Conference name WCGO World Congress of Global Optimization (3rd: 2015: Gainesville, Fla.)
Conference location Gainesville, Fla.
Conference dates 22-25 Feb. 2015
Title of proceedings WCGO 2015 : Advances in Global Optimization. Proceedings of the 3rd World Congress of Global Optimaization
Publication date 2015
Series Springer Proceedings in Mathematics and Statistics v.95
Start page 507
End page 514
Total pages 8
Publisher Springer
Place of publication New York, N.Y.
Keyword(s) Science & Technology
Physical Sciences
Mathematics
Statistics & Probability
NANOROBOTICS
Summary Technologies, such as Atomic Force Microscopy (AFM), have proven to be one of the most versatile research equipments in the field of nanotechnology by providing physical access to the materials at nanoscale. Working principles of AFM involve physical interaction with the sample at nanometre scale to estimate the topography of the sample surface. Size of the cantilever tip, within the range of few nanometres diameter, and inherent elasticity of the cantilever allow it to bend in response to the changes in the sample surface leading to accurate estimation of the sample topography. Despite the capabilities of the AFM, there is a lack of intuitive user interfaces that could allow interaction with the materials at nanoscale, analogous to the way we are accustomed to at macro level. To bridge this gap of intuitive interface design and development, a haptics interface is designed in conjunction with Bruker Nanos AFM. Interaction with the materials at nanoscale is characterised by estimating the forces experienced by the cantilever tip employing geometric deformation principles. Estimated forces are reflected to the user, in a controlled manner, through haptics interface. Established mathematical framework for force estimation can be adopted for AFM operations in air as well as in liquid mediums.
ISBN 9783319083766
ISSN 2194-1009
2194-1017
Language eng
DOI 10.1007/978-3-319-08377-3_49
Field of Research 080110 Simulation and Modelling
091011 Precision Engineering
Socio Economic Objective 970108 Expanding Knowledge in the Information and Computing Sciences
HERDC Research category E1 Full written paper - refereed
ERA Research output type E Conference publication
Copyright notice ©2015, Springer
Persistent URL http://hdl.handle.net/10536/DRO/DU:30074536

Document type: Conference Paper
Collection: Centre for Intelligent Systems Research
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