New developments in the characterization of dislocation loops from LACBED patterns

Morniroli, JP, Marceau, Ross KW and Ringer, SP 2006, New developments in the characterization of dislocation loops from LACBED patterns, Journal of microscopy, vol. 223, no. Pt 3, pp. 246-248, doi: 10.1111/j.1365-2818.2006.01631.x.

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Title New developments in the characterization of dislocation loops from LACBED patterns
Author(s) Morniroli, JP
Marceau, Ross KWORCID iD for Marceau, Ross KW orcid.org/0000-0003-3612-8762
Ringer, SP
Journal name Journal of microscopy
Volume number 223
Issue number Pt 3
Start page 246
End page 248
Total pages 3
Publisher John Wiley & Sons
Place of publication England
Publication date 2006-09
ISSN 0022-2720
Keyword(s) Science & Technology
Technology
Microscopy
convergent-beam electron diffraction
dislocations
electron microscopy
BEAM ELECTRON-DIFFRACTION
Language eng
DOI 10.1111/j.1365-2818.2006.01631.x
Field of Research 0204 Condensed Matter Physics
0912 Materials Engineering
0601 Biochemistry And Cell Biology
HERDC Research category CN.1 Other journal article
Persistent URL http://hdl.handle.net/10536/DRO/DU:30076428

Document type: Journal Article
Collections: Institute for Frontier Materials
GTP Research
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