Preparation of site specific atom probe tips using focused ion beam technology

McGrouther, D, McKenzie, W, Saxey, D, Cairney, JM, Marceau, Ross, Ringer, SP and Munroe, PR 2006, Preparation of site specific atom probe tips using focused ion beam technology, Microscopy and microanalysis, vol. 12, no. SUPPL. 2, pp. 1296-1297, doi: 10.1017/S1431927606062866.

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Title Preparation of site specific atom probe tips using focused ion beam technology
Author(s) McGrouther, D
McKenzie, W
Saxey, D
Cairney, JM
Marceau, RossORCID iD for Marceau, Ross orcid.org/0000-0003-3612-8762
Ringer, SP
Munroe, PR
Journal name Microscopy and microanalysis
Volume number 12
Issue number SUPPL. 2
Start page 1296
End page 1297
Total pages 2
Publisher Cambridge University Press
Publication date 2006-08-01
ISSN 1431-9276
1435-8115
Language eng
DOI 10.1017/S1431927606062866
Field of Research 0204 Condensed Matter Physics
0912 Materials Engineering
0601 Biochemistry And Cell Biology
HERDC Research category CN.1 Other journal article
Persistent URL http://hdl.handle.net/10536/DRO/DU:30076429

Document type: Journal Article
Collection: Institute for Frontier Materials
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