Resistive coupling efficiency criterion for evaluating substrate shielding structures of transformers

Shi, Jinglin, Xiong, Yong Zhong, Brinkhoff, James, Issaoun, Ammar and Lin, Fujiang 2008, Resistive coupling efficiency criterion for evaluating substrate shielding structures of transformers, IEEE Electron Device Letters, vol. 29, no. 1, pp. 114-117, doi: 10.1109/LED.2007.910780.

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Title Resistive coupling efficiency criterion for evaluating substrate shielding structures of transformers
Author(s) Shi, Jinglin
Xiong, Yong Zhong
Brinkhoff, JamesORCID iD for Brinkhoff, James orcid.org/0000-0002-0721-2458
Issaoun, Ammar
Lin, Fujiang
Journal name IEEE Electron Device Letters
Volume number 29
Issue number 1
Start page 114
End page 117
Total pages 4
Publisher Institute of Electrical and Electronics Engineers
Place of publication New York, N.Y.
Publication date 2008-01
ISSN 0741-3106
Keyword(s) Transformers
Substrates
Mutual coupling
Scattering parameters
Coupling circuits
Frequency
Silicon
Coils
Radiofrequency integrated ciarcuits
CMOS process
Maximum power transfer gain $(G_{\max})$
Patterned floating shields (PFSs)
Patterned floating shields (PGSs)
Language eng
DOI 10.1109/LED.2007.910780
Field of Research 0906 Electrical And Electronic Engineering
HERDC Research category C1.1 Refereed article in a scholarly journal
Copyright notice ©2008, IEEE
Persistent URL http://hdl.handle.net/10536/DRO/DU:30086711

Document type: Journal Article
Collection: Faculty of Science, Engineering and Built Environment
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