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Polarized EXAFS, distance-valence least-squares modeling (DVLS), and quantitative texture analysis approaches to the structural refinement of Garfield nontronite

Manceau, A, Chateigner, D and Gates, Will P 1998, Polarized EXAFS, distance-valence least-squares modeling (DVLS), and quantitative texture analysis approaches to the structural refinement of Garfield nontronite, Physics and chemistry of minerals, vol. 25, no. 5, pp. 347-365, doi: 10.1007/s002690050125.

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Title Polarized EXAFS, distance-valence least-squares modeling (DVLS), and quantitative texture analysis approaches to the structural refinement of Garfield nontronite
Author(s) Manceau, A
Chateigner, D
Gates, Will PORCID iD for Gates, Will P orcid.org/0000-0001-7388-0289
Journal name Physics and chemistry of minerals
Volume number 25
Issue number 5
Start page 347
End page 365
Total pages 19
Publisher Springer Verlag
Place of publication Berlin, Germany
Publication date 1998-05
ISSN 0342-1791
1432-2021
Keyword(s) P-EXAFS
polarized extended X-ray absorption fine structure
Garfield nontronite
layer silicates
Language eng
DOI 10.1007/s002690050125
Field of Research 0402 Geochemistry
0912 Materials Engineering
HERDC Research category C1.1 Refereed article in a scholarly journal
Copyright notice ©1998, Springer-Verlag Berlin Heidelberg
Persistent URL http://hdl.handle.net/10536/DRO/DU:30087131

Document type: Journal Article
Collection: Institute for Frontier Materials
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