Cathodoluminescence microanalysis of diamond nanocrystals in fused silicon dioxide

Stevens-Kalceff, M.A., Prawer, S., Kalceff, W., Orwa, J.O., Peng, J.L., McCallum, J.C. and Jamieson, D.N. 2008, Cathodoluminescence microanalysis of diamond nanocrystals in fused silicon dioxide, Journal of applied physics, vol. 104, no. 11, pp. 1-9, doi: 10.1063/1.3039215.

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Title Cathodoluminescence microanalysis of diamond nanocrystals in fused silicon dioxide
Author(s) Stevens-Kalceff, M.A.
Prawer, S.
Kalceff, W.
Orwa, J.O.ORCID iD for Orwa, J.O.
Peng, J.L.
McCallum, J.C.
Jamieson, D.N.
Journal name Journal of applied physics
Volume number 104
Issue number 11
Article ID 113514
Start page 1
End page 9
Total pages 9
Publisher American Institute of Physics
Place of publication Melville, N.Y.
Publication date 2008-12-01
ISSN 0021-8979
Keyword(s) Science & Technology
Physical Sciences
Physics, Applied
Summary MeV carbon ion implantation followed by thermal annealing in a hydrogen-containing atmosphere produces a layer of diamond nanocrystals within fused quartz (SiO2). Cathodoluminescence (CL) microanalysis in a scanning electron microscope has revealed at least three previously unreported low intensity CL emissions from carbon implanted and thermally annealed fused SiO2. The CL emissions are observed at 2.78 eV [full width at half maximum (FWHM) of 0.08 eV], ∼3 eV (FWHM of 0.4 eV), and 3.18 eV (FWHM of 0.11 eV). The peak widths and energies of these emissions are incompatible with any known defects associated with the silicon dioxide host lattice. Nondestructive depth resolved CL microanalysis investigations confirm that these CL emissions originate from the near-surface region, consistent with their association with the layer of diamond nanocrystals.
Language eng
DOI 10.1063/1.3039215
Field of Research 020401 Condensed Matter Characterisation Technique Development
Socio Economic Objective 970102 Expanding Knowledge in the Physical Sciences
HERDC Research category C1.1 Refereed article in a scholarly journal
ERA Research output type C Journal article
Copyright notice ©2008, American Institute of Physics
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