MOSFET model extraction using 50GHz four-port measurements

Brinkhoff, James, Rustagi, SC, Shi, J and Lin, F 2007, MOSFET model extraction using 50GHz four-port measurements, in 2007 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERS, IEEE, Piscataway, N.J., pp. 647-650, doi: 10.1109/RFIC.2007.380966.

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Title MOSFET model extraction using 50GHz four-port measurements
Author(s) Brinkhoff, JamesORCID iD for Brinkhoff, James orcid.org/0000-0002-0721-2458
Rustagi, SC
Shi, J
Lin, F
Conference name IEEE Radio Frequency Integrated Circuits Symposium (RFIC)
Conference location Honolulu, HI
Conference dates 2007/06/03 - 2007/06/05
Title of proceedings 2007 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERS
Editor(s) Kushner, L
Publication date 2007
Series IEEE Radio Frequency Integrated Circuits Symposium
Start page 647
End page 650
Total pages 4
Publisher IEEE
Place of publication Piscataway, N.J.
Keyword(s) Science & Technology
Technology
Engineering, Electrical & Electronic
Telecommunications
Engineering
MOSFETs
modeling
microwave measurements
PARAMETER EXTRACTION
RF MOSFETS
TRANSISTORS
GHZ
ISBN 978-1-4244-0530-5
ISSN 1529-2517
Language eng
DOI 10.1109/RFIC.2007.380966
HERDC Research category EN.1 Other conference paper
Persistent URL http://hdl.handle.net/10536/DRO/DU:30096032

Document type: Conference Paper
Collection: Faculty of Science, Engineering and Built Environment
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