On the deembedding issue of CMOS multigigahertz measurements

Issaoun, Ammar, Xiong, Yong Zhong, Shi, Jinglin, Brinkhoff, James and Lin, Fujiang 2007, On the deembedding issue of CMOS multigigahertz measurements, IEEE transactions on microwave theory and techniques, vol. 55, no. 9, pp. 1813-1822, doi: 10.1109/TMTT.2007.904041.

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Title On the deembedding issue of CMOS multigigahertz measurements
Author(s) Issaoun, Ammar
Xiong, Yong Zhong
Shi, Jinglin
Brinkhoff, JamesORCID iD for Brinkhoff, James orcid.org/0000-0002-0721-2458
Lin, Fujiang
Journal name IEEE transactions on microwave theory and techniques
Volume number 55
Issue number 9
Start page 1813
End page 1822
Total pages 10
Publisher IEEE
Place of publication Piscataway, N.J.
Publication date 2007-09
ISSN 0018-9480
Keyword(s) Deembedding methods
on-wafer measurements
Language eng
DOI 10.1109/TMTT.2007.904041
Field of Research 0906 Electrical And Electronic Engineering
1005 Communications Technologies
HERDC Research category C1.1 Refereed article in a scholarly journal
Copyright notice ©2007, IEEE
Persistent URL http://hdl.handle.net/10536/DRO/DU:30096033

Document type: Journal Article
Collection: Faculty of Science, Engineering and Built Environment
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