Charge trapping and intermodulation in HEMTs

Brinkhoff, James and Parker, AE 2004, Charge trapping and intermodulation in HEMTs, in IEEE MTT-S International Microwave Symposium Digest, IEEE, Piscataway, N.J., pp. 799-802, doi: 10.1109/MWSYM.2004.1339084.

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Title Charge trapping and intermodulation in HEMTs
Author(s) Brinkhoff, JamesORCID iD for Brinkhoff, James orcid.org/0000-0002-0721-2458
Parker, AE
Conference location Fort Worth, TX
Conference dates 2004/11/06 - 2004/11/11
Title of proceedings IEEE MTT-S International Microwave Symposium Digest
Publication date 2004
Start page 799
End page 802
Total pages 4
Publisher IEEE
Place of publication Piscataway, N.J.
ISSN 0149-645X
Language eng
DOI 10.1109/MWSYM.2004.1339084
HERDC Research category EN.1 Other conference paper
Persistent URL http://hdl.handle.net/10536/DRO/DU:30096036

Document type: Conference Paper
Collection: Faculty of Science, Engineering and Built Environment
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