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Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes

Chen, Ying (Ian), Chen, H, Yu, J, Williams, JS and Craig, V 2007, Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes, Applied Physics Letters, vol. 90, no. 9, pp. 093126-093126, doi: 10.1063/1.2710785.

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Title Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes
Author(s) Chen, Ying (Ian)ORCID iD for Chen, Ying (Ian) orcid.org/0000-0002-7322-2224
Chen, H
Yu, J
Williams, JS
Craig, V
Journal name Applied Physics Letters
Volume number 90
Issue number 9
Start page 093126
End page 093126
Total pages 1
Publisher AIP Publishing
Publication date 2007-02-26
ISSN 0003-6951
1077-3118
Language eng
DOI 10.1063/1.2710785
Field of Research 09 Engineering
02 Physical Sciences
HERDC Research category CN.1 Other journal article
Persistent URL http://hdl.handle.net/10536/DRO/DU:30096530

Document type: Journal Article
Collection: Institute for Frontier Materials
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