Use of focused ion beam milling for patterned growth of carbon nanotubes Yu, J, Chen, Ying (Ian), Chen, H and Williams, JS 2008, Use of focused ion beam milling for patterned growth of carbon nanotubes, in Materials Research Society Symposium Proceedings, Cambridge University Press, Cambridge, Eng., pp. 17-23. Title Use of focused ion beam milling for patterned growth of carbon nanotubes Author(s) Yu, J Chen, Ying (Ian) orcid.org/0000-0002-7322-2224 Chen, H Williams, JS Conference location San Francisco, Calif. Conference dates 2008/03/24 - 2008/03/28 Title of proceedings Materials Research Society Symposium Proceedings Publication date 2008 Start page 17 End page 23 Total pages 7 Publisher Cambridge University Press Place of publication Cambridge, Eng. ISBN 9781605608761 ISSN 0272-9172 HERDC Research category EN.1 Other conference paper Persistent URL http://hdl.handle.net/10536/DRO/DU:30096543 Document type: Conference Paper Collection: Institute for Frontier Materials Related Links Link Description   Unless expressly stated otherwise, the copyright for items in DRO is owned by the author, with all rights reserved. Versions Version Filter Type Tue, 16 May 2017, 16:09:49 EST Wed, 17 May 2017, 05:10:33 EST Wed, 17 May 2017, 08:38:45 EST Thu, 21 Sep 2017, 06:19:15 EST Thu, 14 Jun 2018, 09:15:53 EST Thu, 14 Jun 2018, 09:17:26 EST Filtered Full Citation counts:   Cited 0 times in TR Web of Science Cited 0 times in Scopus Search Google Scholar Access Statistics: 15 Abstract Views  -  Detailed Statistics Created: Tue, 16 May 2017, 16:09:49 EST

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