Use of focused ion beam milling for patterned growth of carbon nanotubes

Yu, J, Chen, Ying (Ian), Chen, H and Williams, JS 2008, Use of focused ion beam milling for patterned growth of carbon nanotubes, in Materials Research Society Symposium Proceedings, Cambridge University Press, Cambridge, Eng., pp. 17-23.


Title Use of focused ion beam milling for patterned growth of carbon nanotubes
Author(s) Yu, J
Chen, Ying (Ian)ORCID iD for Chen, Ying (Ian) orcid.org/0000-0002-7322-2224
Chen, H
Williams, JS
Conference location San Francisco, Calif.
Conference dates 2008/03/24 - 2008/03/28
Title of proceedings Materials Research Society Symposium Proceedings
Publication date 2008
Start page 17
End page 23
Total pages 7
Publisher Cambridge University Press
Place of publication Cambridge, Eng.
ISBN 9781605608761
ISSN 0272-9172
HERDC Research category EN.1 Other conference paper
Persistent URL http://hdl.handle.net/10536/DRO/DU:30096543

Document type: Conference Paper
Collection: Institute for Frontier Materials
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