Pulsed-voltage atom probe tomography of low conductivity and insulator materials by application of ultrathin metallic coating on nanoscale specimen geometry

Adineh, Vahid R., Marceau, Ross K.W, Chen, Yu, Si, Kae J., Velkov, Tony, Cheng, Wenlong, Li, Jian and Fu, Jing 2017, Pulsed-voltage atom probe tomography of low conductivity and insulator materials by application of ultrathin metallic coating on nanoscale specimen geometry, Ultramicroscopy, vol. 181, pp. 150-159, doi: 10.1016/j.ultramic.2017.05.002.

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Title Pulsed-voltage atom probe tomography of low conductivity and insulator materials by application of ultrathin metallic coating on nanoscale specimen geometry
Author(s) Adineh, Vahid R.
Marceau, Ross K.WORCID iD for Marceau, Ross K.W orcid.org/0000-0003-3612-8762
Chen, Yu
Si, Kae J.
Velkov, Tony
Cheng, Wenlong
Li, Jian
Fu, Jing
Journal name Ultramicroscopy
Volume number 181
Start page 150
End page 159
Total pages 10
Publisher Elsevier
Place of publication Amsterdam, The Netherlands
Publication date 2017-05
ISSN 1879-2723
Keyword(s) Atom probe tomography
Nanospheres
Physical vapor deposition
Language eng
DOI 10.1016/j.ultramic.2017.05.002
Field of Research 0205 Optical Physics
0299 Other Physical Sciences
HERDC Research category C1 Refereed article in a scholarly journal
Copyright notice ©2017, Elsevier
Persistent URL http://hdl.handle.net/10536/DRO/DU:30096946

Document type: Journal Article
Collections: Institute for Frontier Materials
GTP Research
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