Some aspects of accelerated life testing by progressive stress

Yin, Xiang Kang and Sheng, Bao-Zhong 1987, Some aspects of accelerated life testing by progressive stress, IEEE transactions on reliability, vol. R-36, no. 1, pp. 150-155, doi: 10.1109/TR.1987.5222320.

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Title Some aspects of accelerated life testing by progressive stress
Author(s) Yin, Xiang KangORCID iD for Yin, Xiang Kang orcid.org/0000-0002-7031-414X
Sheng, Bao-Zhong
Journal name IEEE transactions on reliability
Volume number R-36
Issue number 1
Start page 150
End page 155
Total pages 6
Publisher IEEE
Place of publication Piscataway, N.J.
Publication date 1987-04
ISSN 0018-9529
1558-1721
Keyword(s) Science & Technology
Technology
Computer Science, Hardware & Architecture
Computer Science, Software Engineering
Engineering, Electrical & Electronic
Computer Science
Engineering
Language eng
DOI 10.1109/TR.1987.5222320
Field of Research 0803 Computer Software
0906 Electrical And Electronic Engineering
HERDC Research category C1.1 Refereed article in a scholarly journal
Copyright notice ©1987, IEEE
Persistent URL http://hdl.handle.net/10536/DRO/DU:30118260

Document type: Journal Article
Collections: Faculty of Business and Law
Department of Finance
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Scopus Citation Count Cited 36 times in Scopus
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