Empirical investigation into the correlation between vignetting effect and the quality of sensor pattern noise

Li, Chang-Tsun and Satta, R 2012, Empirical investigation into the correlation between vignetting effect and the quality of sensor pattern noise, IET computer vision, vol. 6, no. 6, pp. 560-566, doi: 10.1049/iet-cvi.2012.0044.

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Title Empirical investigation into the correlation between vignetting effect and the quality of sensor pattern noise
Author(s) Li, Chang-TsunORCID iD for Li, Chang-Tsun orcid.org/0000-0003-4735-6138
Satta, R
Journal name IET computer vision
Volume number 6
Issue number 6
Start page 560
End page 566
Total pages 8
Publisher Institution of Engineering and Technology
Place of publication Stevenage, Eng.
Publication date 2012-11
ISSN 1751-9632
1751-9640
Keyword(s) Image processing
Image sensors
Digital forensics
Science & Technology
Technology
Computer Science, Artificial Intelligence
Engineering, Electrical & Electronic
Computer Science
Engineering
Language eng
DOI 10.1049/iet-cvi.2012.0044
Field of Research 0801 Artificial Intelligence and Image Processing
0906 Electrical and Electronic Engineering
1702 Cognitive Sciences
HERDC Research category C1.1 Refereed article in a scholarly journal
Copyright notice ©2012, The Institution of Engineering and Technology
Persistent URL http://hdl.handle.net/10536/DRO/DU:30119446

Document type: Journal Article
Collection: School of Information Technology
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