On the impact of channel outage on the throughput of fast retrial random access for OFDMA uplink

Huang, Weixuan, Choi, Jinho and Kim, Kyeong Soo 2008, On the impact of channel outage on the throughput of fast retrial random access for OFDMA uplink, in IEEE Vehicular Technology Conference, IEEE,, pp. 1940-1943, doi: 10.1109/VETECS.2008.439.

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Title On the impact of channel outage on the throughput of fast retrial random access for OFDMA uplink
Author(s) Huang, Weixuan
Choi, JinhoORCID iD for Choi, Jinho orcid.org/0000-0002-4895-6680
Kim, Kyeong Soo
Conference name 67th IEEE Vehicular Technology Conference
Conference location Marina Bay, SINGAPORE
Conference dates 2008/05/11 - 2008/05/14
Title of proceedings IEEE Vehicular Technology Conference
Publication date 2008
Series IEEE Vehicular Technology Conference Proceedings
Start page 1940
End page 1943
Total pages 4
Publisher IEEE
Keyword(s) Science & Technology
Technology
Engineering, Electrical & Electronic
Telecommunications
Transportation Science & Technology
Engineering
Transportation
NETWORKS
ISBN 9781424416455
ISSN 1550-2252
Language eng
DOI 10.1109/VETECS.2008.439
Indigenous content off
HERDC Research category E1.1 Full written paper - refereed
Persistent URL http://hdl.handle.net/10536/DRO/DU:30125575

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