Testing reflectance models against radiance data Ragheb, Hossein, Robles-Kelly, Antonio and Hancock, Edwin R. 2004, Testing reflectance models against radiance data, in 3DPVT 2004 : Proceedings of the 2nd International Symposium on 3D Data Processing, Visualization and Transmission, IEEE Computer Society, Los Alamitos, Calif., pp. 880-887, doi: 10.1109/TDPVT.2004.1335408. Attached Files Name Description MIMEType Size Downloads Title Testing reflectance models against radiance data Author(s) Ragheb, Hossein Robles-Kelly, Antonio orcid.org/0000-0002-2465-5971 Hancock, Edwin R. Conference name 3DPVT 2004 3D Data Processing, Visualization, and Transmission. International Symposium (2nd : 2004 : Thessaloniki, Greece) Conference location Thessaloniki, Greece Conference dates 06 - 09 Sep. 2004 Title of proceedings 3DPVT 2004 : Proceedings of the 2nd International Symposium on 3D Data Processing, Visualization and Transmission Editor(s) Aloimonos, Yiannis Taubin, Gabriel Publication date 2004 Start page 880 End page 887 Total pages 8 Publisher IEEE Computer Society Place of publication Los Alamitos, Calif. Keyword(s) Science & Technology Technology Computer Science, Artificial Intelligence Computer Science, Software Engineering Computer Science DIFFUSE SCATTERING testing reflectivity rough surfaces surface roughness light scattering computer vision computer graphics surface waves cameras ISBN 0-7695-2223-8 Language eng DOI 10.1109/TDPVT.2004.1335408 Indigenous content off HERDC Research category E1.1 Full written paper - refereed Copyright notice ©2004, IEEE Persistent URL http://hdl.handle.net/10536/DRO/DU:30126828 Document type: Conference Paper Collections: Faculty of Science, Engineering and Built Environment School of Information Technology Related Links Link Description Connect to Published Version Go to link with your DU access privileges     Unless expressly stated otherwise, the copyright for items in DRO is owned by the author, with all rights reserved. Versions Version Filter Type Thu, 18 Jul 2019, 13:46:53 EST Fri, 19 Jul 2019, 05:05:05 EST Fri, 19 Jul 2019, 06:06:32 EST Thu, 12 Nov 2020, 07:08:38 EST Thu, 12 Nov 2020, 07:14:01 EST Fri, 13 Nov 2020, 06:56:39 EST Filtered Full Citation counts:   Cited 0 times in TR Web of Science Cited 0 times in Scopus Search Google Scholar Access Statistics: 19 Abstract Views, 0 File Downloads  -  Detailed Statistics Created: Thu, 18 Jul 2019, 13:46:53 EST

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