Probing of near surface semiconductor layers by electron energy loss spectroscopy

Jones, TS, Ding, MQ, Richardson, NV, McConville, Christopher F and Schweitzer, MO 1990, Probing of near surface semiconductor layers by electron energy loss spectroscopy, Journal of Electron Spectroscopy and Related Phenomena, vol. 54-55, no. C, pp. 1163-1172, doi: 10.1016/0368-2048(90)80306-U.

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Title Probing of near surface semiconductor layers by electron energy loss spectroscopy
Author(s) Jones, TS
Ding, MQ
Richardson, NV
McConville, Christopher FORCID iD for McConville, Christopher F orcid.org/0000-0003-1040-2794
Schweitzer, MO
Journal name Journal of Electron Spectroscopy and Related Phenomena
Volume number 54-55
Issue number C
Start page 1163
End page 1172
Total pages 10
Publisher ELSEVIER SCIENCE BV
Place of publication SHELTER ISLAND, NY
Publication date 1990-01-01
ISSN 0368-2048
Keyword(s) Science & Technology
Technology
Spectroscopy
INTERFACE
PLASMONS
PHONONS
Language eng
DOI 10.1016/0368-2048(90)80306-U
Indigenous content off
Field of Research 0202 Atomic, Molecular, Nuclear, Particle and Plasma Physics
0204 Condensed Matter Physics
0306 Physical Chemistry (incl. Structural)
HERDC Research category C1 Refereed article in a scholarly journal
Persistent URL http://hdl.handle.net/10536/DRO/DU:30142237

Document type: Journal Article
Collection: Office of the Deputy Vice-Chancellor (Research)
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