Probing of near surface semiconductor layers by electron energy loss spectroscopy
Jones, TS, Ding, MQ, Richardson, NV, McConville, Christopher F and Schweitzer, MO 1990, Probing of near surface semiconductor layers by electron energy loss spectroscopy, Journal of Electron Spectroscopy and Related Phenomena, vol. 54-55, no. C, pp. 1163-1172, doi: 10.1016/0368-2048(90)80306-U.
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Probing of near surface semiconductor layers by electron energy loss spectroscopy
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