Low energy ion beam damage of semiconductor surfaces: a detailed study of InSb(100) using electron energy loss spectroscopy Jones, TS, Ding, MQ, Richardson, NV and McConville, Christopher F 1991, Low energy ion beam damage of semiconductor surfaces: a detailed study of InSb(100) using electron energy loss spectroscopy, Surface Science, vol. 247, no. 1, pp. 1-12, doi: 10.1016/0039-6028(91)90189-Y. Attached Files Name Description MIMEType Size Downloads Title Low energy ion beam damage of semiconductor surfaces: a detailed study of InSb(100) using electron energy loss spectroscopy Author(s) Jones, TS Ding, MQ Richardson, NV McConville, Christopher F orcid.org/0000-0003-1040-2794 Journal name Surface Science Volume number 247 Issue number 1 Start page 1 End page 12 Total pages 12 Publisher ELSEVIER SCIENCE BV Publication date 1991-05-01 ISSN 0039-6028 Keyword(s) Science & Technology Physical Sciences Chemistry, Physical Physics, Condensed Matter Chemistry Physics SPACE-CHARGE LAYER COUPLED PLASMON EXCITATIONS GAAS(110) PHONON GAAS EELS Language eng DOI 10.1016/0039-6028(91)90189-Y Indigenous content off Field of Research 0204 Condensed Matter Physics 0206 Quantum Physics 0306 Physical Chemistry (incl. Structural) HERDC Research category C1 Refereed article in a scholarly journal Persistent URL http://hdl.handle.net/10536/DRO/DU:30142241 Document type: Journal Article Collection: Office of the Deputy Vice-Chancellor (Research) Related Links Link Description Connect to published version Go to link with your DU access privileges     Unless expressly stated otherwise, the copyright for items in DRO is owned by the author, with all rights reserved. Versions Version Filter Type Thu, 17 Sep 2020, 14:46:32 EST Fri, 18 Sep 2020, 05:01:24 EST Fri, 18 Sep 2020, 06:04:49 EST Wed, 28 Oct 2020, 11:07:34 EST Wed, 28 Oct 2020, 11:08:20 EST Wed, 28 Oct 2020, 15:01:53 EST Tue, 03 Nov 2020, 08:44:56 EST Filtered Full Citation counts:   Cited 36 times in TR Web of Science Cited 35 times in Scopus Search Google Scholar Access Statistics: 11 Abstract Views, 1 File Downloads  -  Detailed Statistics Created: Thu, 17 Sep 2020, 14:46:32 EST

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