Low energy ion beam damage of semiconductor surfaces: a detailed study of InSb(100) using electron energy loss spectroscopy
Jones, TS, Ding, MQ, Richardson, NV and McConville, Christopher F 1991, Low energy ion beam damage of semiconductor surfaces: a detailed study of InSb(100) using electron energy loss spectroscopy, Surface Science, vol. 247, no. 1, pp. 1-12, doi: 10.1016/0039-6028(91)90189-Y.
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Low energy ion beam damage of semiconductor surfaces: a detailed study of InSb(100) using electron energy loss spectroscopy
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