Imaging ion-bombarded III-V semiconductor surfaces: A scanning tunnelling microscopy study of InSb(100) Schweitzer, MO, Leibsle, FM, Jones, TS, McConville, Christopher F and Richardson, NV 1993, Imaging ion-bombarded III-V semiconductor surfaces: A scanning tunnelling microscopy study of InSb(100), Semiconductor Science and Technology, vol. 8, no. 1S, pp. S342-S344, doi: 10.1088/0268-1242/8/1S/076. Attached Files Name Description MIMEType Size Downloads Title Imaging ion-bombarded III-V semiconductor surfaces: A scanning tunnelling microscopy study of InSb(100) Author(s) Schweitzer, MO Leibsle, FM Jones, TS McConville, Christopher F orcid.org/0000-0003-1040-2794 Richardson, NV Journal name Semiconductor Science and Technology Volume number 8 Issue number 1S Start page S342 End page S344 Total pages 3 Publisher IOP PUBLISHING LTD Place of publication SOUTHAMPTON, ENGLAND Publication date 1993-12-01 ISSN 0268-1242 1361-6641 Keyword(s) Science & Technology Technology Physical Sciences Engineering, Electrical & Electronic Materials Science, Multidisciplinary Physics, Condensed Matter Engineering Materials Science Physics DAMAGE Language eng DOI 10.1088/0268-1242/8/1S/076 Indigenous content off Field of Research 0204 Condensed Matter Physics 0906 Electrical and Electronic Engineering 0912 Materials Engineering HERDC Research category C1 Refereed article in a scholarly journal Persistent URL http://hdl.handle.net/10536/DRO/DU:30142249 Document type: Journal Article Collection: Office of the Deputy Vice-Chancellor (Research) Related Links Link Description Connect to published version Go to link with your DU access privileges     Unless expressly stated otherwise, the copyright for items in DRO is owned by the author, with all rights reserved. Versions Version Filter Type Thu, 17 Sep 2020, 14:58:58 EST Fri, 18 Sep 2020, 05:01:32 EST Fri, 18 Sep 2020, 06:04:58 EST Wed, 28 Oct 2020, 11:29:33 EST Wed, 28 Oct 2020, 11:30:30 EST Wed, 28 Oct 2020, 15:02:07 EST Tue, 03 Nov 2020, 08:49:37 EST Filtered Full Citation counts:   Cited 8 times in TR Web of Science Cited 10 times in Scopus Search Google Scholar Access Statistics: 17 Abstract Views, 1 File Downloads  -  Detailed Statistics Created: Thu, 17 Sep 2020, 14:58:58 EST

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