Imaging ion-bombarded III-V semiconductor surfaces: A scanning tunnelling microscopy study of InSb(100)
Schweitzer, MO, Leibsle, FM, Jones, TS, McConville, Christopher F and Richardson, NV 1993, Imaging ion-bombarded III-V semiconductor surfaces: A scanning tunnelling microscopy study of InSb(100), Semiconductor Science and Technology, vol. 8, no. 1S, pp. S342-S344, doi: 10.1088/0268-1242/8/1S/076.
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Imaging ion-bombarded III-V semiconductor surfaces: A scanning tunnelling microscopy study of InSb(100)
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