Probing the interfacial and sub‐surface structure of Si/Si1−xGex multilayers

Sugden, S, Sofield, CJ, Noakes, TCQ, Kubiak, RAA and McConville, Christopher F 1995, Probing the interfacial and sub‐surface structure of Si/Si1−xGex multilayers, Applied Physics Letters, vol. 66, no. 21, pp. 2849, doi: 10.1063/1.113450.


Title Probing the interfacial and sub‐surface structure of Si/Si1−xGex multilayers
Author(s) Sugden, S
Sofield, CJ
Noakes, TCQ
Kubiak, RAA
McConville, Christopher FORCID iD for McConville, Christopher F orcid.org/0000-0003-1040-2794
Journal name Applied Physics Letters
Volume number 66
Issue number 21
Start page 2849
Publisher AIP Publishing
Publication date 1995-01-01
ISSN 0003-6951
1077-3118
Language eng
DOI 10.1063/1.113450
Indigenous content off
Field of Research 02 Physical Sciences
09 Engineering
10 Technology
HERDC Research category C1 Refereed article in a scholarly journal
Persistent URL http://hdl.handle.net/10536/DRO/DU:30142264

Document type: Journal Article
Collection: Office of the Deputy Vice-Chancellor (Research)
Connect to link resolver
 
Unless expressly stated otherwise, the copyright for items in DRO is owned by the author, with all rights reserved.

Versions
Version Filter Type
Citation counts: TR Web of Science Citation Count  Cited 6 times in TR Web of Science
Scopus Citation Count Cited 7 times in Scopus
Google Scholar Search Google Scholar
Access Statistics: 10 Abstract Views  -  Detailed Statistics
Created: Fri, 18 Sep 2020, 12:43:56 EST

Every reasonable effort has been made to ensure that permission has been obtained for items included in DRO. If you believe that your rights have been infringed by this repository, please contact drosupport@deakin.edu.au.