Surface morphology during strain relaxation in the growth of InAs on GaAs(110) Belk, JG, Pashley, DW, McConville, Christopher F, Joyce, BA and Jones, TS 1998, Surface morphology during strain relaxation in the growth of InAs on GaAs(110), Surface Science, vol. 410, no. 1, pp. 82-98, doi: 10.1016/S0039-6028(98)00300-8. Attached Files Name Description MIMEType Size Downloads Title Surface morphology during strain relaxation in the growth of InAs on GaAs(110) Author(s) Belk, JG Pashley, DW McConville, Christopher F orcid.org/0000-0003-1040-2794 Joyce, BA Jones, TS Journal name Surface Science Volume number 410 Issue number 1 Start page 82 End page 98 Total pages 17 Publisher ELSEVIER SCIENCE BV Publication date 1998-07-20 ISSN 0039-6028 Keyword(s) Science & Technology Physical Sciences Chemistry, Physical Physics, Condensed Matter Chemistry Physics diffusion and migration epitaxy gallium arsenide indium arsenide low index single crystal surfaces molecular beam epitaxy (MBE) nucleation reflection high-energy electron diffraction (RHEED) scanning tunneling microscopy semiconductor-semiconductor heterostructures single crystal epitaxy surface structure, morphology, roughness, and topography MOLECULAR-BEAM EPITAXY SCANNING-TUNNELING-MICROSCOPY MISFIT DISLOCATIONS GAAS(001)-C(4X4) RELIEF FILMS Language eng DOI 10.1016/S0039-6028(98)00300-8 Indigenous content off Field of Research 0204 Condensed Matter Physics 0206 Quantum Physics 0306 Physical Chemistry (incl. Structural) HERDC Research category C1 Refereed article in a scholarly journal Persistent URL http://hdl.handle.net/10536/DRO/DU:30142287 Document type: Journal Article Collection: Office of the Deputy Vice-Chancellor (Research) Related Links Link Description Connect to published version Go to link with your DU access privileges     Unless expressly stated otherwise, the copyright for items in DRO is owned by the author, with all rights reserved. Versions Version Filter Type Fri, 18 Sep 2020, 13:45:24 EST Sat, 19 Sep 2020, 05:00:54 EST Sat, 19 Sep 2020, 06:04:10 EST Wed, 28 Oct 2020, 13:12:55 EST Wed, 28 Oct 2020, 13:13:44 EST Wed, 28 Oct 2020, 15:03:06 EST Tue, 03 Nov 2020, 08:59:29 EST Filtered Full Citation counts:   Cited 18 times in TR Web of Science Cited 17 times in Scopus Search Google Scholar Access Statistics: 11 Abstract Views, 1 File Downloads  -  Detailed Statistics Created: Fri, 18 Sep 2020, 13:45:24 EST

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