Profiling of electron accumulation layers in the near-surface region of InAs (110)

Veal, TD and McConville, Christopher F 2001, Profiling of electron accumulation layers in the near-surface region of InAs (110), Physical Review B - Condensed Matter and Materials Physics, vol. 64, no. 8, doi: 10.1103/PhysRevB.64.085311.

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Title Profiling of electron accumulation layers in the near-surface region of InAs (110)
Author(s) Veal, TD
McConville, Christopher FORCID iD for McConville, Christopher F orcid.org/0000-0003-1040-2794
Journal name Physical Review B - Condensed Matter and Materials Physics
Volume number 64
Issue number 8
Article ID ARTN 085311
Total pages 8
Publisher AMER PHYSICAL SOC
Publication date 2001-01-01
ISSN 1098-0121
1550-235X
Keyword(s) Science & Technology
Technology
Physical Sciences
Materials Science, Multidisciplinary
Physics, Applied
Physics, Condensed Matter
Materials Science
Physics
PLASMON EXCITATIONS
INAS(110) SURFACE
SPECTROSCOPY
INAS(001)
DAMAGE
Language eng
DOI 10.1103/PhysRevB.64.085311
Indigenous content off
Field of Research 02 Physical Sciences
03 Chemical Sciences
09 Engineering
HERDC Research category C1 Refereed article in a scholarly journal
Persistent URL http://hdl.handle.net/10536/DRO/DU:30142310

Document type: Journal Article
Collection: Office of the Deputy Vice-Chancellor (Research)
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