Determination of the variation in sputter yield in the SIMS transient region using MEIS
Dowsett, MG, Ormsby, TJ, Gard, FS, Al-Harthi, SH, Guzmán, B, McConville, Christopher F, Noakes, TCQ and Bailey, P 2003, Determination of the variation in sputter yield in the SIMS transient region using MEIS, Applied Surface Science, vol. 203-204, pp. 363-366, doi: 10.1016/S0169-4332(02)00879-6.
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Determination of the variation in sputter yield in the SIMS transient region using MEIS
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