Accurate ultra‐low‐energy secondary ion mass spectrometry analysis of wide bandgap GaN/InxGa1–xN structures using optical conductivity enhancement

Morris, RJH, Dowsett, MG, Beanland, R, Parbrook, PJ and McConville, Christopher F 2010, Accurate ultra‐low‐energy secondary ion mass spectrometry analysis of wide bandgap GaN/InxGa1–xN structures using optical conductivity enhancement, Rapid Communications in Mass Spectrometry, vol. 24, no. 14, pp. 2122-2126, doi: 10.1002/rcm.4623.

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Title Accurate ultra‐low‐energy secondary ion mass spectrometry analysis of wide bandgap GaN/InxGa1–xN structures using optical conductivity enhancement
Author(s) Morris, RJH
Dowsett, MG
Beanland, R
Parbrook, PJ
McConville, Christopher FORCID iD for McConville, Christopher F orcid.org/0000-0003-1040-2794
Journal name Rapid Communications in Mass Spectrometry
Volume number 24
Issue number 14
Start page 2122
End page 2126
Total pages 5
Publisher WILEY
Place of publication England
Publication date 2010-07-01
ISSN 0951-4198
1097-0231
Keyword(s) Science & Technology
Life Sciences & Biomedicine
Physical Sciences
Technology
Biochemical Research Methods
Chemistry, Analytical
Spectroscopy
Biochemistry & Molecular Biology
Chemistry
CHARGE COMPENSATION
PROTOCOLS
GROWTH
BEAM
SIMS
Language eng
DOI 10.1002/rcm.4623
Indigenous content off
Field of Research 03 Chemical Sciences
04 Earth Sciences
06 Biological Sciences
HERDC Research category C1 Refereed article in a scholarly journal
Persistent URL http://hdl.handle.net/10536/DRO/DU:30142689

Document type: Journal Article
Collection: Office of the Deputy Vice-Chancellor (Research)
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