Accurate ultra‐low‐energy secondary ion mass spectrometry analysis of wide bandgap GaN/InxGa1–xN structures using optical conductivity enhancement
Morris, RJH, Dowsett, MG, Beanland, R, Parbrook, PJ and McConville, Christopher F 2010, Accurate ultra‐low‐energy secondary ion mass spectrometry analysis of wide bandgap GaN/InxGa1–xN structures using optical conductivity enhancement, Rapid Communications in Mass Spectrometry, vol. 24, no. 14, pp. 2122-2126, doi: 10.1002/rcm.4623.
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Accurate ultra‐low‐energy secondary ion mass spectrometry analysis of wide bandgap GaN/InxGa1–xN structures using optical conductivity enhancement
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