Valence-band structure of InN from x-ray photoemission spectroscopy

Piper, L. F. J., Veal, T. D., Jefferson, P. H., McConville, C. F., Fuchs, F., Furthmüller, J., Bechstedt, F., Lu, Hai and Schaff, W. J. 2005, Valence-band structure of InN from x-ray photoemission spectroscopy, Physical Review B - Condensed Matter and Materials Physics, vol. 72, no. 24, pp. 245319-1-245319-5, doi: 10.1103/PhysRevB.72.245319.

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Title Valence-band structure of InN from x-ray photoemission spectroscopy
Author(s) Piper, L. F. J.
Veal, T. D.
Jefferson, P. H.
McConville, C. F.ORCID iD for McConville, C. F. orcid.org/0000-0003-1040-2794
Fuchs, F.
Furthmüller, J.
Bechstedt, F.
Lu, Hai
Schaff, W. J.
Journal name Physical Review B - Condensed Matter and Materials Physics
Volume number 72
Issue number 24
Article ID 245319
Start page 245319-1
End page 245319-5
Total pages 5
Publisher American Physical Society
Place of publication College Park, Md.
Publication date 2005-12-14
ISSN 1098-0121
1550-235X
Keyword(s) Science & Technology
Technology
Physical Sciences
Materials Science, Multidisciplinary
Physics, Applied
Physics, Condensed Matter
Materials Science
Physics
TOTAL-ENERGY CALCULATIONS
INDIUM NITRIDE
GAP
SEMICONDUCTORS
ABSORPTION
GAN(0001)
SURFACES
STATES
LAYER
Language eng
DOI 10.1103/PhysRevB.72.245319
Indigenous content off
Field of Research 02 Physical Sciences
03 Chemical Sciences
09 Engineering
HERDC Research category C1 Refereed article in a scholarly journal
Copyright notice ©2005, American Physical Society
Persistent URL http://hdl.handle.net/10536/DRO/DU:30142713

Document type: Journal Article
Collection: Deputy Vice-Chancellor Research Group
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