Growth of thin platinum films on Cu(1 0 0): CAICISS, XPS and LEED studies

Walker, M, Parkinson, CR, Draxler, M and McConville, Christopher 2005, Growth of thin platinum films on Cu(1 0 0): CAICISS, XPS and LEED studies, Surface Science, vol. 584, no. 2-3, pp. 153-160, doi: 10.1016/j.susc.2005.03.050.


Title Growth of thin platinum films on Cu(1 0 0): CAICISS, XPS and LEED studies
Author(s) Walker, M
Parkinson, CR
Draxler, M
McConville, ChristopherORCID iD for McConville, Christopher orcid.org/0000-0003-1040-2794
Journal name Surface Science
Volume number 584
Issue number 2-3
Start page 153
End page 160
Total pages 8
Publisher ELSEVIER SCIENCE BV
Publication date 2005-06-20
ISSN 0039-6028
1879-2758
Keyword(s) Science & Technology
Physical Sciences
Chemistry, Physical
Physics, Condensed Matter
Chemistry
Physics
low energy ion scattering (LEIS)
low energy electron diffraction (LEED)
X-ray photoelectron spectroscopy
platinum
copper
alloys
PT/CU SURFACE ALLOYS
ION-SCATTERING
OXYGEN
ADSORPTION
MULTILAYERS
CU(111)
PT(111)
CO/PT
CU
Language eng
DOI 10.1016/j.susc.2005.03.050
Indigenous content off
Field of Research 0204 Condensed Matter Physics
0206 Quantum Physics
0306 Physical Chemistry (incl. Structural)
HERDC Research category C1 Refereed article in a scholarly journal
Persistent URL http://hdl.handle.net/10536/DRO/DU:30142724

Document type: Journal Article
Collection: Office of the Deputy Vice-Chancellor (Research)
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