Surface Structure and Electronic Properties of In2O3(111) Single-Crystal Thin Films Grown on Y-Stabilized ZrO2(111)

Zhang, KHL, Payne, DJ, Palgrave, RG, Lazarov, VK, Chen, W, Wee, ATS, McConville, Christopher, King, PDC, Veal, TD, Panaccione, G, Lacovig, P and Egdell, RG 2009, Surface Structure and Electronic Properties of In2O3(111) Single-Crystal Thin Films Grown on Y-Stabilized ZrO2(111), Chemistry of Materials, vol. 21, no. 19, pp. 4353-4355, doi: 10.1021/cm901127r.


Title Surface Structure and Electronic Properties of In2O3(111) Single-Crystal Thin Films Grown on Y-Stabilized ZrO2(111)
Author(s) Zhang, KHL
Payne, DJ
Palgrave, RG
Lazarov, VK
Chen, W
Wee, ATS
McConville, ChristopherORCID iD for McConville, Christopher orcid.org/0000-0003-1040-2794
King, PDC
Veal, TD
Panaccione, G
Lacovig, P
Egdell, RG
Journal name Chemistry of Materials
Volume number 21
Issue number 19
Start page 4353
End page 4355
Total pages 3
Publisher AMER CHEMICAL SOC
Publication date 2009-10-13
ISSN 0897-4756
1520-5002
Keyword(s) Science & Technology
Physical Sciences
Technology
Chemistry, Physical
Materials Science, Multidisciplinary
Chemistry
Materials Science
X-RAY-DIFFRACTION
TRANSPARENT
Language eng
DOI 10.1021/cm901127r
Indigenous content off
Field of Research 03 Chemical Sciences
09 Engineering
HERDC Research category C1 Refereed article in a scholarly journal
Persistent URL http://hdl.handle.net/10536/DRO/DU:30142750

Document type: Journal Article
Collection: Office of the Deputy Vice-Chancellor (Research)
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