Influence of growth conditions and polarity on interface-related electron density in InN King, PDC, Veal, TD, Gallinat, CS, Koblmüller, G, Bailey, LR, Speck, JS and McConville, Christopher 2008, Influence of growth conditions and polarity on interface-related electron density in InN, Journal of Applied Physics, vol. 104, no. 10, doi: 10.1063/1.3020528. Title Influence of growth conditions and polarity on interface-related electron density in InN Author(s) King, PDC Veal, TD Gallinat, CS Koblmüller, G Bailey, LR Speck, JS McConville, Christopher orcid.org/0000-0003-1040-2794 Journal name Journal of Applied Physics Volume number 104 Issue number 10 Article ID ARTN 103703 Total pages 5 Publisher AMER INST PHYSICS Publication date 2008-12-08 ISSN 0021-8979 1089-7550 Keyword(s) Science & Technology Physical Sciences Physics, Applied Physics buffer layers Fermi level gallium compounds Hall effect III-V semiconductors indium compounds semiconductor growth semiconductor thin films valence bands wide band gap semiconductors MOLECULAR-BEAM EPITAXY MULTIPLE CARRIER TRANSPORT INDIUM NITRIDE BAND-GAP SEMICONDUCTORS ACCUMULATION Language eng DOI 10.1063/1.3020528 Indigenous content off Field of Research 01 Mathematical Sciences 02 Physical Sciences 09 Engineering HERDC Research category C1 Refereed article in a scholarly journal Persistent URL http://hdl.handle.net/10536/DRO/DU:30142758 Document type: Journal Article Collection: Office of the Deputy Vice-Chancellor (Research) Related Links Link Description Connect to published version Go to link with your DU access privileges     Unless expressly stated otherwise, the copyright for items in DRO is owned by the author, with all rights reserved. Versions Version Filter Type Tue, 22 Sep 2020, 16:47:30 EST Wed, 23 Sep 2020, 05:04:15 EST Wed, 23 Sep 2020, 06:05:37 EST Fri, 02 Oct 2020, 13:59:15 EST Fri, 02 Oct 2020, 13:59:55 EST Filtered Full Citation counts:   Cited 15 times in TR Web of Science Cited 14 times in Scopus Search Google Scholar Access Statistics: 14 Abstract Views  -  Detailed Statistics Created: Tue, 22 Sep 2020, 16:47:30 EST

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