Modeling wheat yield with data-intelligent algorithms: artificial neural network versus genetic programming and minimax probability machine regression
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posted on 2024-05-30, 11:41 authored by Mumtaz Ali, Ravinesh C DeoModeling wheat yield with data-intelligent algorithms: artificial neural network versus genetic programming and minimax probability machine regression
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engPublication classification
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22Chapter number
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37-87ISBN-13
9780128165140ISBN-10
0128165146Publisher
ElsevierPlace of publication
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Handbook of Probabilistic ModelsUsage metrics
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