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AFM image analysis for haptics enabled force feedback framework

conference contribution
posted on 2010-01-01, 00:00 authored by Asim BhattiAsim Bhatti
AFM image analysis for haptics enabled force feedback framework

History

Event

Nanoscience and Nanotechnology. International Conference (2010 : Sydney, N. S. W.)

Pagination

1 - 1

Publisher

IEEE

Location

Sydney, N. S. W.

Place of publication

[Sydney, N. S. W.]

Start date

2010-02-22

End date

2010-02-26

ISBN-13

9781424452613

ISBN-10

1424452619

Language

eng

Publication classification

E3.1 Extract of paper

Title of proceedings

ICONN 2010 : Proceedings of the Nanoscience and Nanotechnology 2010 International conference

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    Research Publications

    Categories

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    Keywords

    AFM image analysishapticsforce feedback framework

    Licence

    All Rights Reserved

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