A new methodology for retrieval of grain depth information from scanning polychromatic X-ray microdiffraction data
conference contribution
posted on 2009-01-01, 00:00 authored by Peter LynchPeter Lynch, A Stevenson, D Tomus, C Bettles, M Gibson, D LiangA new methodology for retrieval of grain depth information from scanning polychromatic X-ray microdiffraction data
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Event
Synchrotron Radiation and Instrumentation. Conference (10th : 2009 : Melbourne, Victoria)Publisher
[The Conference]Location
Melbourne, VictoriaPlace of publication
[Melbourne, Vic.]Start date
2009-09-28End date
2009-10-02Language
engPublication classification
E2.1 Full written paper - non-refereed / Abstract reviewedCopyright notice
2009, The AuthorsTitle of proceedings
SRI09 : Proceedings of the 10th International Conference on Synchrotron Radiation and InstrumentationUsage metrics
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